The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Jul. 25, 2019
Applicant:

Daicel Corporation, Osaka, JP;

Inventors:

Toru Kitaguchi, Tokyo, JP;

Hiroshi Miyazaki, Tokyo, JP;

Yuko Sakaguchi, Tokyo, JP;

Assignee:

Daicel Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61M 5/30 (2006.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
A61M 5/30 (2013.01); G01N 21/359 (2013.01);
Abstract

This application relates to a measurement system for measuring a behavior of an ejection liquid, which is ejected into an object from an ejection device, within the object. The system includes a container part formed of a resin material. The system also includes an imaging device disposed to image, across the object, a tip surface of the container part having an ejection port formed therein and being in contact with the object from a back side of the object in a predetermined state in which the ejection port is positioned from a front side of the object. The system further includes a first emission device that emits first near infrared light to the tip surface. In such a configuration, the behavior of the ejection liquid when the ejection liquid is ejected into the object from the ejection device can be imaged and measured by the imaging device.


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