The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
May. 05, 2020
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Keith William Johnson, Lynwood, WA (US);
Anne Holmes, Bothell, WA (US);
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/483 (2013.01); A61B 8/469 (2013.01); A61B 8/5207 (2013.01); A61B 8/5292 (2013.01); A61B 8/54 (2013.01); A61B 8/585 (2013.01);
Abstract
The present disclosure describes systems and methods for determining if a feature of interest is present in a volume or plane scanned by an imaging system. In examples, one or more imaging planes are analyzed for anatomical landmarks to determine whether a feature of interest is present. If the feature of interest is present, scan parameters may be determined to scan an adjusted volume that includes the feature of interest. In some applications, the adjusted volume may allow the imaging system to increase a volume rate.