The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Oct. 14, 2021
Alcon Inc., Fribourg, CH;
Robert Dimitri Angelopoulos, San Jose, CA (US);
Bryan Stanfill, Mansfield, TX (US);
Alcon Inc., Fribourg, CH;
Abstract
A method for estimating biometric landmark dimensional measurements of a human eye includes, in a possible embodiment, receiving one or more images of the human eye via a host computer. In response to receiving the one or more images, the method includes generating a preliminary set of landmark point locations in the one or more images via the host computer using a deep-learning algorithm, and then refining the preliminary set of landmark point locations using a post-hoc processing routine of the host computer to thereby generate a final set of estimated landmark point locations. Additionally, the biometric landmark dimensional measurements are automatically generated via the host computer using the final set of estimated landmark point locations. A data set is then output that is inclusive of the set of estimated landmark point locations. A host computer that executes instructions from memory to perform the method.