The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Dec. 17, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Weimin Duan, San Diego, CA (US);

Alexandros Manolakos, Escondido, CA (US);

Guttorm Ringstad Opshaug, Redwood City, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 74/0833 (2024.01); H04B 17/27 (2015.01); H04B 17/327 (2015.01); H04L 5/00 (2006.01); H04W 64/00 (2009.01); H04W 4/029 (2018.01);
U.S. Cl.
CPC ...
H04W 74/0833 (2013.01); H04B 17/27 (2015.01); H04B 17/327 (2015.01); H04L 5/0048 (2013.01); H04W 64/003 (2013.01); H04W 4/029 (2018.02);
Abstract

In an aspect, a communications device obtains a residual AoA bias associated with a first AoA measurement of a RS-P transmitted from a wireless reference node to a first base station, the wireless reference node associated with a location known to the communications device, obtains a second AoA measurement associated with an uplink signal (e.g., PRACH, SRS, UL-SRS-P, etc.) transmitted from a UE to the first base station, and calibrates the second AoA measurement based on the residual AoA bias. In another aspect, a communications device obtains a residual AoD bias associated with a first AoD measurement of a RS-P transmitted from a first base station to a wireless reference node with a known location, obtains a second AoD measurement associated with a downlink signal (e.g., DL-PRS) transmitted from the first base station to a UE, and calibrates the second AoD measurement based on the residual AoD bias.


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