The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Apr. 18, 2024
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Yuka Ogino, Tokyo, JP;
Keiichi Chono, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/611 (2023.01); G06T 7/70 (2017.01); G06V 40/19 (2022.01); H04N 23/667 (2023.01); H04N 23/67 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
H04N 23/611 (2023.01); G06T 7/70 (2017.01); G06V 40/19 (2022.01); H04N 23/667 (2023.01); H04N 23/67 (2023.01); H04N 23/90 (2023.01); G06T 2207/30201 (2013.01);
Abstract
An imaging system is provided with: a first imaging apparatus () that captures an image of an imaging target (T, TP) that is located at a first point (P); a second imaging apparatus () a focus position of which is set at a second point (P) that is located at a forward side along a moving direction of the imaging target than the first point; and a control apparatus () that controls the second imaging apparatus to capture an image of the imaging target that is located at the second point on the basis of the image () captured by the first imaging apparatus.