The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Mar. 20, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yinji Piao, Suwon-si, KR;

Kyungah Kim, Suwon-si, KR;

Minsoo Park, Suwon-si, KR;

Minwoo Park, Suwon-si, KR;

Kwangpyo Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/70 (2014.01); H04N 19/174 (2014.01); H04N 19/91 (2014.01);
U.S. Cl.
CPC ...
H04N 19/91 (2014.11); H04N 19/174 (2014.11); H04N 19/70 (2014.11);
Abstract

An entropy decoding method may include obtaining, from a bitstream, information about a slice type, based on an occurrence probability of a symbol, performing arithmetic decoding on a current symbol corresponding to a syntax element, when the information about the slice type indicates an I slice, determining a first scaling factor for updating the occurrence probability of the symbol by using a first function, wherein a value of the first function is determined based on a first threshold value, when the information about the slice type indicates a B or P slice, determining the first scaling factor by using a second function, wherein a value of the second function is determined based on a second threshold value, and by using the first scaling factor, updating the occurrence probability of the symbol.


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