The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Aug. 08, 2022
Fujifilm Business Innovation Corp., Tokyo, JP;
FUJIFILM BUSINESS INNOVATION CORP., Tokyo, JP;
Abstract
A printed-matter inspection system includes a processor for evaluating quality of printed matter, and a display apparatus. The processor is configured, by reading a program for execution, to: for each of multiple pages in a job, if the page is an inspection target, compare, for inspection, a scanned image with a reference image, the scanned image being obtained through scanning of printed matter in the page, the reference image being generated by using rasterized data for the page; and, in display of the result of the inspection on the display apparatus, display the scanned image for the page that is an inspection target, and display, for a page that is not an inspection target, a dummy page and information indicating that the page is not an inspection target, the dummy page being a substitute of the scanned image.