The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Feb. 16, 2024
Viken Detection Corporation, Burlington, MA (US);
Peter John Rothschild, Newton, MA (US);
Viken Detection Corporation, Burlington, MA (US);
Abstract
An x-ray scanning system, and corresponding method, includes an x-ray source that produces incident x-ray radiation having end-point x-ray energy, which, in various embodiments, can be greater than about 200 keV, between about 200 keV and about 500 keV, or greater than about 500 keV. The system also includes a disk chopper wheel that can be irradiated by and attenuate the incident x-ray radiation. The disk chopper wheel further defines one or more slits configured to pass the incident x-ray radiation through the disk chopper wheel for scanning a target. In some embodiments, the high end-point x-ray energies with disk chopper wheels are facilitated by forming the incident x-ray radiation as a collimated fan beam and/or orienting the chopper wheel with a wheel plane substantially non-perpendicular to a fan beam plane, increasing effective thickness of a disk chopper wheel to attenuate incident x-rays of higher energies.