The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Dec. 30, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Shih-Chao Chien, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for detecting defect of images applied in an electronic device inputs flawless sample training images into an autoencoder, and calculates first latent feature by a coding layer of the autoencoder, and calculates first reconstructed images by a decoding layer, and calculates a first reconstruction error by a first preset error function. The electronic device trains the discriminator according to the flawless sample training images and first reconstructed images, and calculates an adversarial learning error, and calculates a sample error, determines an error threshold based on the sample error, and obtains testing sample images, and calculates second latent feature of the testing sample images by the coding layer, and calculates the second reconstructed images of the testing sample images by the decoding layer, and calculate a difference between the testing sample images and the second reconstructed images, thus a detection result of the testing sample images is determined.