The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12347168 B1

Date of Patent:

Jul. 01, 2025

Filed:

Dec. 21, 2022

System and method for classifying images with a combination of nearest-neighbor-based label propagation and kernel principal component analysis

Applicant:

Hrl Laboratories, Llc, Malibu, CA (US);

Inventors:

Joseph Comer, Portland, OR (US);

Heiko Hoffmann, Simi Valley, CA (US);

Assignee:

HRL LABORATORIES, LLC, Malibu, CA (US);

Attorney:

TOPE-MCKAY & ASSOCIATES

Primary Examiner:

David F Dunphy

Int. Cl.

CPC ...

G06V 10/764 (2022.01); G06V 10/44 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);

U.S. Cl.

CPC ...

G06V 10/764 (2022.01); G06V 10/44 (2022.01); G06V 10/7753 (2022.01); G06V 10/82 (2022.01);

Abstract

Described is a system for detecting and classifying new patterns of objects and images for applications where labeled data is scarce. In operation, the system trains a neural network with unlabeled images and extracts features with the neural network from both the unlabeled images and a set of labeled images to generate a feature space. Labels are propagated in the feature space using nearest neighbors, allowing for modeling of a per-class simplified distribution. An object in a new test image can then be classified using reconstruction error based on the per-class simplified distributions.

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