The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Jul. 19, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Qingfeng Liu, San Diego, CA (US);

Mostafa El-Khamy, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/11 (2017.01); G06V 10/26 (2022.01); G06V 10/52 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 10/52 (2022.01); G06T 7/11 (2017.01); G06V 10/26 (2022.01); G06V 10/7715 (2022.01);
Abstract

A computer vision system including: one or more processors; and memory including instructions that, when executed by the one or more processors, cause the one or more processors to: determine a semantic multi-scale context feature and an instance multi-scale context feature of an input scene; generate a joint attention map based on the semantic multi-scale context feature and the instance multi-scale context feature; refine the semantic multi-scale context feature and instance multi-scale context feature based on the joint attention map; and generate a panoptic segmentation image based on the refined semantic multi-scale context feature and the refined instance multi-scale context feature.


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Liu, Qingfeng. (2025). System and method for dual-value attention and instance boundary aware regression in computer vision system (U.S. Patent No. 12347161). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12347161

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