The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Mar. 31, 2025
China National Institute of Standardization, Beijing, CN;
China National Institute of Standardization, Beijing, CN;
Abstract
Disclosed is a method for determining a number of product quality incidents based on a convolutional neural network, the method includes the following steps: building an appearance quality dataset, building a quality evaluation model, and analyzing a number of product quality incidents; a preset model and a preset optimized model are trained and validated according to the built appearance quality dataset to obtain initial quality evaluation models, which are filtered to obtain a quality evaluation model according to model performance coefficient and comprehensive model coefficient, product appearance defect data are obtained according to appearance defect data detected and obtained by the quality evaluation model, appearance defect ratio and significant appearance defect ratio of the products under quality inspection are obtained according to the product appearance defect data, and a number of product quality incidents of the products under quality inspection is finally obtained according to an incident occurrence coefficient.