The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
May. 21, 2021
Beijing Zhongxiangying Technology Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Yaoping Wang, Beijing, CN;
Meijuan Zhang, Beijing, CN;
Wangqiang He, Beijing, CN;
Dong Chai, Beijing, CN;
Hong Wang, Beijing, CN;
BEIJING ZHONGXIANGYING TECHNOLOGY CO., LTD., Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
Provided is a method and device for detecting defect, a computer readable storage medium and an electronic device, the method including: acquiring (S) a detection task, and acquiring various types of images corresponding to the detection task; acquiring (S) defect detection models trained by a same initial model corresponding to the types of the images respectively; and obtaining (S) defect detection results by performing defect detection on respective type of images using the defect detection model corresponding to the type of the images.