The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Sep. 22, 2020
Bentley Systems, Incorporated, Exton, PA (US);
Bentley Systems, Incorporated, Exton, PA (US);
Abstract
In various example embodiments, techniques are provided for crack detection, assessment and visualization that utilize deep learning in combination with a 3D mesh model. Deep learning is applied to a set of 2D images of infrastructure to identify and segment surface cracks. For example, a Faster region-based convolutional neural network (Faster-RCNN) may identify surface cracks and a structured random forest edge detection (SFRED) technique may segment the identified surface cracks. Alternatively, a Mask region-based convolutional neural network (Mask-RCNN) may identify and segment surface cracks in parallel. Photogrammetry is used to generate a textured three-dimensional (3D) mesh model of the infrastructure from the 2D images. A texture cover of the 3D mesh model is analyzed to determine quantitative measures of identified surface cracks. The 3D mesh model is displayed to provide a visualization of identified surface cracks and facilitate inspection of the infrastructure.