The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Jan. 28, 2023
Applicant:

Foundation for Research and Business, Seoul National University of Science and Technology, Seoul, KR;

Inventors:

Dong Ho Kim, Seoul, KR;

Jung Seok Park, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 7/50 (2017.01); G06T 7/70 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G06T 7/50 (2017.01); G06T 7/70 (2017.01); G06T 11/003 (2013.01);
Abstract

Provided are a system and a method for generating a high-resolution 3D model. According to an embodiment, a high-resolution 3D image is generated by correcting the following losses: symmetry loss that includes image symmetry loss and vertex symmetry loss between a 3D refined image and a symmetry image symmetrical to the 3D refined image with symmetry reliability degrees of a training device; displacement loss between vertexes of the 3D model image and vertexes of the 3D refined image refined on the basis of vertex coordinate information of the training device; silhouette loss through silhouette comparison between the original image and the 3D model image resulting from conversion into a derived view point of a spherical coordinate system; and edge loss and line loss between the original image and the 3D refined image.


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