The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Jul. 07, 2021
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Vinay Sawal, Fremont, CA (US);

Jayanth Kumar Reddy Perneti, Bangalore, IN;

Sithiqu Shahul Hameed, Chennai, IN;

Assignee:

DELL PRODUCTS L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2023.01); G06F 40/126 (2020.01); G06F 40/166 (2020.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06F 40/126 (2020.01); G06F 40/166 (2020.01); G06N 3/08 (2013.01);
Abstract

Presented herein are embodiments that use a language model to embed or encode configuration elements (e.g., commands, prompts, etc.) into dense, latent representations that incorporate semantic and contextual information. Using a trained language model, a configuration for a network device may be converted into a set of configuration path sentences. Given a first set of encoded configuration path sentences for a first configuration and a second set of encoded configuration path sentences for a second configuration, these two sets may be compared to gauge a degree of difference between the two sets. In one or more embodiments, an Optimal Transport method with Wasserstein distance metric may be used to obtain a comparison value that gauges difference between the two configurations. In one or more embodiments, the comparison valuation may be labeled or classified by comparing the comparison value to one or more pre-defined thresholds.


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