The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Jul. 15, 2022
Applicant:

Arm Limited, Cambridge, GB;

Inventors:

Matthew David Haddon, Bishop's Stortford, GB;

Igor Fedorov, Ashland, MA (US);

Reiley Jeyapaul, Haverhill, GB;

Paul Nicholas Whatmough, Cambridge, MA (US);

Zhi-Gang Liu, Westford, MA (US);

Assignee:

Arm Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/64 (2013.01); G06F 16/22 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 21/64 (2013.01); G06F 16/2264 (2019.01); G06F 16/2365 (2019.01);
Abstract

Methods and systems for detecting errors when performing a convolutional operation is provided. Predicted checksum data, corresponding to input checksum data and kernel checksum data, is obtained. The convolutional operation is performed to obtain an output feature map. Output checksum data is generated and the predicted checksum data and the output checksum data are compared, the comparing taking account of partial predicted checksum data configured to correct for a lack of padding when performing the convolution operation, wherein the partial predicted checksum data corresponds to input checksum data for a subset of the values in the input feature map and kernel checksum data for a subset of the values in the kernel.


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