The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Nov. 16, 2021
Applicant:

Foursquare Labs, Inc., New York, NY (US);

Inventors:

Isaac Mehro Brodsky, Burlingame, CA (US);

Shan He, San Francisco, CA (US);

Ib Green, San Carlos, CA (US);

Sina Rassaei Kashuk, San Francisco, CA (US);

Assignee:

FOURSQUARE LABS, INC., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/29 (2019.01); G06F 16/248 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/29 (2019.01); G06F 16/248 (2019.01); G06F 16/285 (2019.01);
Abstract

The disclosure relates to a system and method for facilitating geospatial processing and analysis of datasets and providing a visualization of geospatial analytics data over a network. The platform utilizes a discrete global grid system to partition an area (e.g., a map, a city, a state, a country, a continent, the world, etc.) into a set of discrete grid cells. The set of grid cells can be subdivided into finer resolutions of grids. In examples, the platform generates and employs the use of hex tiles for the grid cells.


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