The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Mar. 31, 2023
Woven BY Toyota, Inc., Tokyo, JP;
Hiroyuki Usui, Tokyo, JP;
Go Matsukawa, Edogawa-ku, JP;
Motofumi Kashiwaya, Tokyo, JP;
Noriyasu Hashiguchi, Tokyo, JP;
WOVEN BY TOYOTA, INC., Tokyo, JP;
Abstract
Provided are a system, method, and device for intelligent test environment allocation. According to embodiments, the method for intelligently determining one or more test environments for testing software of an embedded system, may include: obtaining, by a task allocator, capability information of a plurality of test environments; obtaining, by the task allocator, policy information of a task to be executed for testing the software of the embedded system; determining, by the task allocator, a test environment, from among the plurality of test environments, that satisfies the policy information; and allocating, by the task allocator, the task to the determined test environment, wherein the embedded system may be an in-vehicle electronic control unit (ECU), and wherein the plurality of tests environments may include at least one software-in-the-loop (SIL) test environment, at least one hardware-in-the-loop (HIL) test environment, and at least one virtual ECU (V-ECU) test environment.