The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Oct. 12, 2020
Valeo Schalter Und Sensoren Gmbh, Bietigheim-Bissingen, DE;
Sergio Fernandez, Bietigheim-Bissingen, DE;
Shuyun Guo, Bietigheim-Bissingen, DE;
Christoph Pfrang, Bietigheim-Bissingen, DE;
Valeo Schalter und Sensoren GmbH, Bietigheim-Bissingen, DE;
Abstract
According to a method for filtering measurement data of a sensor system (), light pulses () reflected in the environment of the sensor system () are captured by means of an array () of optical detectors (). A multiplicity of measurement signals () are generated by means of the array () based on the captured light pulses. A computing unit () identifies a first measurement signal () whose pulse energy is greater than a specified minimum energy, wherein the first measurement signal () was generated by a first detector (). A second measurement signal () is compared with the first measurement signal () by means of the computing unit (), wherein the second measurement signal () was generated by a second detector (), which is at a distance from the first detector () that is less than or equal to a specified maximum distance. The computing unit discards at least a part of the second measurement signal depending on a result of the comparison.