The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Dec. 06, 2019
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Akira Tsuji, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G01S 17/894 (2020.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G06T 7/11 (2017.01); G06T 2207/10028 (2013.01);
Abstract
A measurement control apparatus () according to the present disclosure includes: a detection unit () configured to detect an abnormal part of point group data acquired from a three-dimensional optical sensor; a control unit () configured to control the orientation of the three-dimensional optical sensor in accordance with the abnormal part detected by the detection unit (); and a determination unit () configured to determine the case of the abnormality of the abnormal part detected by the detection unit () based on the point group data measured by the three-dimensional optical sensor in the orientation controlled by the control unit ().