The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Mar. 01, 2021
Applicant:

Intelon Optics, Inc., Lexington, MA (US);

Inventors:

Jang Lawrence Hyun Yoo, Los Angeles, CA (US);

Kwangsup Shin, Bedford, MA (US);

Yen-Wei Lin, Natick, MA (US);

Assignee:

Intelon Optics, Inc., Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/483 (2006.01); G01N 21/63 (2006.01); G01N 33/50 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G01N 33/4833 (2013.01); G01N 21/636 (2013.01); G06F 17/18 (2013.01); G01N 2021/638 (2013.01);
Abstract

A method of measuring at least one biomechanical property of a reproductive cellular structure is provided. The method includes illuminating the reproductive cellular structure with radiation; detecting at least a portion of radiation scattered from the illuminated reproductive cellular structure; analyzing a frequency spectrum of the detected scattered radiation to identify at least one Brillouin frequency shift in the frequency spectrum; and determining the at least one biomechanical property based on the Brillouin frequency shift. The method further includes determining a viability index of the reproductive cellular structure based on the at least one biomechanical property.


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