The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Mar. 31, 2021
Applicants:

Safran, Paris, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Ecole Superieure DE Physique ET DE Chimie Industrielle DE LA Ville DE Paris, Paris, FR;

Inventors:

Cecile Brutt, Moissy-Cramayel, FR;

Benoit Gerardin, Moissy-Cramayel, FR;

Alexandre Aubry, Paris, FR;

Arnaud Derode, Paris, FR;

Claire Prada, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/38 (2006.01); G01N 29/44 (2006.01); G01N 29/46 (2006.01);
U.S. Cl.
CPC ...
G01N 29/04 (2013.01); G01N 29/043 (2013.01); G01N 29/38 (2013.01); G01N 29/44 (2013.01); G01N 29/46 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/106 (2013.01);
Abstract

A device, for non-destructive testing of a mechanical part made of a polycrystalline material, includes: an ultrasonic probe including a two-dimensional array of transducers capable of emitting and receiving signals at different excitation angles; and a processing module suitable for controlling the emission and the reception of the transducers, for processing the signals received by the transducers so as to express the signals received by the ultrasonic probe in two planar wave planes constructed from the emission and reception wave vectors of the probe, and for deducing therefrom information representative of the three-dimensional orientation of the fiber structure of the mechanical part.


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