The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Jun. 11, 2021
Shanghai Jiaotong University, Shanghai, CN;
Jiao Zhang, Shanghai, CN;
Yang Tang, Shanghai, CN;
Ya Zhang, Shanghai, CN;
Yue Wu, Shanghai, CN;
Hui Xing, Shanghai, CN;
Baode Sun, Shanghai, CN;
Yanfeng Han, Shanghai, CN;
Yongbing Dai, Shanghai, CN;
Chaopeng Fu, Shanghai, CN;
Qing Dong, Shanghai, CN;
SHANGHAI JIAOTONG UNIVERSITY, Shanghai, CN;
Abstract
A multi-physical field measurement device for a metal solidification process and a housing and a measurement method thereof are provided. The device includes: a sealed housing provided with a light-through hole; a heater provided inside the housing and located behind the light-through hole along an X-ray; a diffraction detector used for receiving the X-ray which penetrates through a sample sheet and is scattered; a CMOS camera located behind the heater along the X-ray () and used for receiving a visible light signal which penetrates through the sample sheet; a silicon drift X-ray detector located at one side of the X-ray and used for receiving a fluorescent signal sent by interaction between the X-ray and the sample sheet; and an infrared thermal imager located at the other side of the X-ray and used for receiving an infrared signal sent by the sample sheet.