The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Dec. 10, 2021
Applicant:

Uponor Oyj, Vantaa, FI;

Inventors:

Esa Hämäläinen, Nokia, FI;

Tero Kesti, Tampere, FI;

Teemu Heikkilä, Helsinki, FI;

Vili Hätönen, Helsinki, FI;

Oskari Lehto, Helsinki, FI;

Joel Pyykkö, Helsinki, FI;

Assignee:

UPONOR OYJ, Vantaa, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/18 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01N 21/453 (2013.01); G01N 33/18 (2013.01); G01N 2201/1296 (2013.01);
Abstract

It is an objective to provide a fluid quality measurement device. According to an embodiment, a fluid quality measurement device is configured to: obtain a plurality of holograms, wherein each hologram in the plurality of holograms represents a microscopic object in a fluid sample; produce a latent space representation of each hologram using a trained autoencoder neural network; assign each hologram in the plurality of holograms to a class based on the latent space representation of the hologram; and produce a fluid sample fingerprint based on the assignment of the plurality of holograms into the plurality of classes.


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