The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Dec. 22, 2021
Omya International Ag, Oftringen, CH;
Roger Bollstrom, Zofingen, CH;
Gilbert Botty, Maastricht, NL;
OMYA INTERNATIONAL AG, Oftringen, CH;
Abstract
A method for detecting amorphous and/or crystalline structures of phosphate and/or sulphate salts on or within a substrate involves providing an LWIR imaging system with an infrared light emitting source (A) configured to emit infrared light over the range of 8 to 14 micrometers, an LWIR detecting device (B) configured to detect the intensity of electromagnetic radiation scattered, emitted, and/or reflected by the substrate, and control circuitry for the LWIR detecting device. The method further comprises providing the substrate, irradiating it with the infrared light emitting source, acquiring a stream of temporally consecutive images using the LWIR detecting device, and selecting, based on processing the acquired stream of images with the control circuitry, at least one focused image where the amorphous and/or crystalline structures of phosphate and/or sulphate salts are substantially in focus of the LWIR detecting device.