The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Nov. 28, 2022
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Rostislav Vatchev Roussev, Painted Post, NY (US);

Nathaniel David Wetmore, Corning, NY (US);

Assignee:

CORNING INCORPORATED, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/25 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 21/255 (2013.01); G01N 21/274 (2013.01); G01N 2201/0634 (2013.01); G01N 2201/127 (2013.01);
Abstract

Methods and apparatus for obtaining a corrected digital mode spectrum for a chemically strengthened (CS) substrate having a curved surface are disclosed. The methods include digitally capturing transverse magnetic (TM) and transverse electric (TE) mode spectra of the CS substrate to form a digital mode spectrum image using an evanescent prism coupling system having a system calibration for measuring flat CS substrates. The method further includes establishing a calibration correction based on the difference in the digitally captured TM and TE mode spectra as compared to a reference TM and TE mode spectra for a reference CS substrate. The calibration correction is applied to the digital mode spectrum image to form the corrected digital mode spectrum image, which can be processed using the system calibration for measuring flat CS substrates to determine a refractive index profile and stress characteristics for the curved CS substrate.


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