The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Sep. 10, 2021
Fanuc Corporation, Yamanashi, JP;
Nobuhito Oonishi, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
Provided are an abnormality determination system and program that make it possible to accurately detect abnormalities at a machine tool. An abnormality determination system that comprises a detection threshold determination unit that determines a detection threshold for detecting abnormalities at the machine tool on the basis of a motor inference information and an inference precision, a motor measurement unit that acquires motor measurement information about a motor, and a state determination unit that determines the state of the machine tool on the basis of the motor measurement information and the detection threshold.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile