The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Oct. 16, 2022
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01K 11/32 (2021.01); G01K 11/3206 (2021.01); G01K 1/26 (2006.01);
U.S. Cl.
CPC ...
G01L 1/242 (2013.01); G01K 11/32 (2013.01); G01K 11/3206 (2013.01); G01K 1/26 (2013.01);
Abstract
Aspects of the present disclosure describe Rayleigh-based DTSS that utilizes few-mode fiber (FMF), which supports multiple spatial modes. For each spatial mode, a wavelength-scanning configuration gives the relative wavelength (or frequency) shift between two consecutive measurements. The temperature and strain changes can therefore be separated through different temperature/strain sensitivities of various mode-pairs. Advantageously, Rayleigh-based DTSS according to aspects of the present disclosure removes temperature-strain ambiguity, enhances measurement accuracy, reduces errors. and enables new features for multi-parameter sensing.