The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Mar. 08, 2022
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Ryker Eads, Tucson, AZ (US);

James Roger P. Angel, Tucson, AZ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
F24S 40/90 (2018.01); F24S 23/71 (2018.01); F24S 50/20 (2018.01); G01M 11/00 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
F24S 40/90 (2018.05); F24S 23/715 (2018.05); F24S 50/20 (2018.05); G01M 11/005 (2013.01); G01M 11/025 (2013.01); F24S 2050/25 (2018.05);
Abstract

A system for providing a contour map of the surface of a heliostat from reflected sunlight using a fly's eye camera. The system includes an entrance screen configured to receive sunlight reflected by said heliostat; an array of imaging apertures extending across the entrance screen, each aperture forming an image of said heliostat from a different viewpoint to provide a plurality of heliostat images; one or more digital cameras configured to view all of said plurality of heliostat images; an image processor configured to map out from the plurality of heliostat images a location of sunlight delivered to the entrance screen to obtain a plurality of maps, and to provide, based on centroids of said maps a tip and tilt of each said subsection The reflecting surface profile of the heliostat is obtained by integration of the subsection tilts across all the subsections.


Find Patent Forward Citations

Eads, Ryker. (2025). Instrumentation and methods for optical metrology of heliostats (U.S. Patent No. 12345446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12345446

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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