The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Aug. 26, 2020
Applicant:

Komatsu Ltd., Tokyo, JP;

Inventors:

Yuichi Kodama, Tokyo, JP;

Shinichi Terada, Tokyo, JP;

Eiichi Morioka, Tokyo, JP;

Takashi Nagayoshi, Tokyo, JP;

Assignee:

KOMATSU LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21C 41/22 (2006.01); E21C 39/00 (2006.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
E21C 41/22 (2013.01); E21C 39/00 (2013.01); G01N 23/223 (2013.01); G01N 2223/0745 (2013.01);
Abstract

A measurement systemmeasures a grade of an excavated material generated from an underground tunnel including a plurality of mining points. The underground tunnel is constructed based on a mining plan of a mine planned based on primary grade data and primary position data corresponding to the primary grade data measured in a preliminary geological survey. The measurement system includes a measuring unit (grade measuring unit)that measures the grade of the excavated material generated from the underground tunnel, a secondary grade data acquisition unit (grade data acquisition unit)that acquires secondary grade data indicating the grade of the excavated material from the measuring unit, and a secondary position data acquisition unit (position data acquisition unit)that acquires secondary position data corresponding to the secondary grade data.


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