The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Nov. 19, 2021
Applicant:

Erowa Ag, Reinach, CH;

Inventor:

Hans Hediger, Reinach, CH;

Assignee:

Erowa AG, Reinach, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/00 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/005 (2013.01); G05B 2219/50183 (2013.01);
Abstract

The invention relates to a monitoring arrangement () for monitoring the clamping quality of a workpiece carrier clamped in a clamping device () as well as a clamping system with clamping device () and such a monitoring arrangement (). The monitoring arrangement comprises at least two sensors (A-A) for the independent detection of the clamping quality of a clamped workpiece carrier or workpiece. The monitoring arrangement also comprises a transmitting device () and a receiving device (), wherein the transmitting device () is constituted such that it transmits the determined or calculated parameter or parameters redundantly to the receiving device ().


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Hediger, Hans. (2025). Monitoring arrangement, clamping system with a monitoring arrangement and method for monitoring a clamping device by means of a monitoring arrangement (U.S. Patent No. 12343837). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12343837

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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