The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Aug. 04, 2021
Applicants:

Hefei Xinsheng Optoelectronics Technology Co., Ltd., Anhui, CN;

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Ning Liu, Beijing, CN;

Dacheng Zhang, Beijing, CN;

Cheng Xu, Beijing, CN;

Danyang Ma, Beijing, CN;

Liusong Ni, Beijing, CN;

Jun Liu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 86/40 (2025.01); H10D 30/67 (2025.01); H10D 86/60 (2025.01); H10K 50/86 (2023.01); H10K 59/12 (2023.01); H10K 59/121 (2023.01); H10K 59/131 (2023.01); H10K 71/00 (2023.01);
U.S. Cl.
CPC ...
H10D 86/423 (2025.01); H10K 50/865 (2023.02); H10K 71/00 (2023.02); H10K 59/1201 (2023.02); H10K 59/131 (2023.02);
Abstract

Provided are an array substrate, a display panel, a display apparatus and a method for manufacturing an array substrate. The array substrate includes: a base substrate; an active layer, which is located on one side of the base substrate, where the active layer includes a channel region, a conductive source region, which is located on one side of the channel region, and a conductive drain region, which is located on the other side of the channel region; and a metal layer, which is located on the side of the active layer that is away from the base substrate, where the metal layer includes a gate electrode and a signal line, which are arranged on the same layer, and the thickness of the gate electrode perpendicular to the base substrate is less than the thickness of the signal line perpendicular to the base substrate.


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