The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Nov. 28, 2022
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Mukesh Rao Engla Syam, Bangalore, IN;

Nicholas Paul Cowley, Wroughton, GB;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/673 (2023.01); H04N 17/00 (2006.01); H04N 25/702 (2023.01); H04N 25/78 (2023.01);
U.S. Cl.
CPC ...
H04N 25/673 (2023.01); H04N 17/002 (2013.01); H04N 25/702 (2023.01); H04N 25/78 (2023.01);
Abstract

An image sensor may include an array of pixels and associated delay calibration circuitry for determining an amount of delay for row control signals. The delay calibration circuitry can include circuitry for generating a calibration row control signal, circuitry for propagating the calibration row control signal down a row of dummy pixels, and one or more sampling circuits coupled to one or more tap points in the row of dummy pixels for monitoring when the calibration row control signal arrives at the one or more tap points. The array of pixels can output signals during normal operation. The image sensor may include column readout circuitry for reading out the signals from the array of pixels. The column readout circuitry can be controlled using sampling signals that are progressively delayed based on count values output from the one or more sampling circuits.


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