The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Jul. 25, 2023
Applicants:

Samsung Display Co., Ltd., Yongin-si, KR;

University-industry Cooperation Group of Kyung Hee University, Yongin-si, KR;

Inventors:

Ha Young Lee, Yongin-si, KR;

Sung Wook Min, Seoul, KR;

Young Rok Kim, Hwaseong-si, KR;

Jae Joong Kwon, Yongin-si, KR;

Jin Seo, Yongin-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/106 (2018.01); G03H 1/10 (2006.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/106 (2018.05); G03H 1/10 (2013.01); H04N 2013/0081 (2013.01);
Abstract

A system for measuring a depth of a stereoscopic image includes a display device displaying a stereoscopic image at a predetermined depth of field; a holographic camera generating an interference pattern image by sensing a wavelength and a phase of light of the stereoscopic image; and a control unit calculating a plurality of modulated image data having image information of the stereoscopic image at each depth of the plurality of depths based on the wavelength and the phase of the light, calculating edges of a field in each of the plurality of modulated image data to obtain edge detection values, calculating a modulated signal by arranging the edge detection values according to a depth in the each of the plurality of modulated image data, calculating a first maximum value of the modulated signal, and calculating a first depth corresponding to the first maximum value as the depth of field.


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