The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Dec. 20, 2023
Applicant:

SK Hynix Nand Product Solutions Corp., Rancho Cordova, CA (US);

Inventors:

Zion Kwok, Burnaby, CA;

Young Joon Ji, Vancouver, CA;

Assignee:

SK Hynix NAND Product Solutions Corp., Rancho Cordova, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1108 (2013.01); H03M 13/1128 (2013.01); H03M 13/1131 (2013.01);
Abstract

This application is directed to error correction for data stored in a memory device. In response to a request to validate a block of data, the memory device identifies a set of check nodes corresponding to a set of variable nodes that represent the block of data. First check node values of the check nodes are determined based on the block of data, and stored in first registers. The memory device implements a plurality of iterations of error correction by flipping a subset of variable nodes successively during each iteration; determining second check node values of the check nodes; and updating the first check node values stored in the first registers based on the second check node values once in each of a first set of iterations and successively with flipping of each variable node in a second set of iterations following the first set of iterations.


Find Patent Forward Citations

Loading…