The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
May. 19, 2023
Samsung Display Co., Ltd., Yongin-si, KR;
Jinwoo Park, Yongin-si, KR;
Bogeun Yuk, Yongin-si, KR;
Taejoon Kim, Yongin-si, KR;
Seungrok Lee, Yongin-si, KR;
Il Ho Lee, Yongin-si, KR;
SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;
Abstract
An electronic device testing method includes providing an electronic device including a display layer including a common electrode and a sensor layer that is disposed on the display layer and that includes a plurality of first electrodes and a plurality of second electrodes that insulatively intersect the plurality of first electrodes, measuring a plurality of jitter values of a plurality of channels formed by the plurality of first electrodes and the plurality of second electrodes, calculating a first value being an average of the plurality of jitter values, calculating a second value by summing jitter values, among the plurality of jitter values, of channels formed by one of the plurality of second electrodes among the plurality of channels, and testing the common electrode based on a third value obtained by dividing the second value by the first value.