The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Jun. 15, 2021
Tungsten Automation Corporation, Irvine, CA (US);
Christopher W. Thrasher, Rochester, NY (US);
Alexander Shustorovich, Pittsford, NY (US);
Stephen Michael Thompson, Oceanside, CA (US);
Jan W. Amtrup, Silver Spring, MD (US);
Anthony Macciola, Irvine, CA (US);
Tungsten Automation Corporation, Irvine, CA (US);
Abstract
Techniques for binarization and extraction of information from image data are disclosed. The inventive concepts include independently binarizing portions of the image data on the basis of individual features, e.g. per connected component, and using multiple different binarization thresholds to obtain the best possible binarization result for each portion of the image data. Determining the quality of each binarization result may be based on attempted recognition and/or extraction of information therefrom. Independently binarized portions may be assembled into a contiguous result. In one embodiment, a method includes: identifying a region of interest within a digital image; generating a plurality of binarized images based on the region of interest using different binarization thresholds; and extracting data from some or all of the plurality of binarized images. The extracted data includes connected components that overlap and/or are obscured by unique background. Corresponding systems and computer program products are disclosed.