The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

May. 12, 2022
Applicant:

Kyocera Document Solutions Inc., Osaka, JP;

Inventors:

Shiro Kaneko, Osaka, JP;

Kanako Morimoto, Osaka, JP;

Takuya Miyamoto, Osaka, JP;

Naomichi Higashiyama, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/60 (2024.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 5/20 (2013.01); G06T 2207/30144 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An image processing apparatus compares a target image and a reference image and thereby detects an anomaly in the target image, and includes an anomaly detecting unit. The anomaly detecting unit is configured to (a) generate a first characteristic map obtained by performing a filter process for the target image and a second characteristic map obtained by performing the filter process for the reference image, (b) derive a correction amount on the basis of a deviation between an object in the first characteristic map and an object in the second characteristic map, and (c) correct the target image and/or the reference image with the correction amount and thereafter compare the target image and the reference image and thereby detect an anomaly in the target image.


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