The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Feb. 20, 2020
Applicant:
Dmg Mori Co., Ltd., Nara, JP;
Inventor:
Junichiro Okuno, Sapporo, JP;
Assignee:
DMG MORI CO., LTD., Nara, JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 11/00 (2006.01); B23Q 17/24 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B23Q 11/0042 (2013.01); B23Q 17/2409 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30141 (2013.01);
Abstract
To easily and accurately detect chips produced when processing a work by a machine tool, there is provided a chip detection apparatus for detecting chips produced when processing a work by a machine tool. The chip detection apparatus includes a mesh divider that performs processing of dividing, into a plurality of mesh images in a predetermined mesh size, at least part of an area image obtained by capturing a target area where the chips are to be detected, and a chip information determiner that determines chip information concerning the chips for each of the mesh images using a determination parameter preset for determining the chip information.