The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Dec. 01, 2019
Applicant:
Siemens Aktiengesellschaft, Munich, DE;
Inventors:
Yonatan Hyatt, Tel-Aviv, IL;
Harel Boren, Givat Shmuel, IL;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G05B 19/418 (2006.01); G08B 5/22 (2006.01); H04N 23/56 (2023.01); H04N 23/60 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G05B 19/41875 (2013.01); G08B 5/22 (2013.01); G05B 2219/32181 (2013.01); G06T 2207/30108 (2013.01); H04N 23/56 (2023.01); H04N 23/60 (2023.01);
Abstract
A visual inspection data collection and analysis system comprising: a plurality of visual inspection appliances (VTA) configured to inspect and acquire visual inspection data relating to inspected items; and a data collection and analytics server (DCAS) configured to receive information comprising the visual inspection data from the multiple VIAs and to analyze the received information to form a big data analysis. The VIAs are adapted for detecting defects or gating or counting the inspected items without the involvement of the DCAS.