The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Sep. 23, 2022
Applicants:

Siemens Healthineers Ag, Forchheim, DE;

The Regents of the University of California, Oakland, CA (US);

Inventors:

Chang Gao, Los Angeles, CA (US);

John Paul Finn, Los Angeles, CA (US);

Xiaodong Zhong, Oak Park, CA (US);

Assignees:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G01R 33/4818 (2013.01); G06T 11/006 (2013.01); G01R 33/4824 (2013.01);
Abstract

A system and methods for recreating images from undersampled magnetic resonance imaging (MRI) image data to remove artifacts from the undersampling. Using trained transformer networks, undersampled k-space data can be acquired and the networks can predict additional projected radial MRI k-space data from the undersampled radial MRI k-space data. Images with fewer artifacts can then be generated.


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Gao, Chang. (2025). Method and apparatus for accelerated acquisition and artifact reduction of undersampled mri using a k-space transformer network (U.S. Patent No. 12340443). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12340443

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