The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Dec. 10, 2021
Accenture Global Solutions Limited, Dublin, IE;
Rajarajan Tr, Bangalore, IN;
Auri Priyadharshini Munivelu, Bangalore, IN;
Venkata Rama Krishna P, Chebrole, IN;
Jhilam Dutta, Bangalore, IN;
Ravi Kanth Vinnakota, Bangalore, IN;
Sudhanshu Sharma, Bangalore, IN;
Yash Mishra, Ajmer, IN;
Accenture Global Solutions Limited, Dublin, IE;
Abstract
Aspects of the present disclosure provide systems, methods, and computer-readable storage media that support functionality for identifying, quantifying, and mitigating risks. A dataset that includes a plurality of data items associated with one or more entities is generated and a set of rules is executed against the dataset to determine a sentiment for each data item of the plurality of data items. The dataset may be evaluated against a machine learning model configured to produce a set of risk categorizations that associate each of the plurality of data items with a risk category. Scoring metrics are generated for each of the data items based at least in part on the evaluating. The scoring metrics may account for an impact of dependencies and capabilities of the one or more entities on risks corresponding to the risk categorizations. A data structure may be created and displayed to the user based on the scoring metrics, where the data structure is configured to quantify risks identified for each of the entities and to identify actions configured to mitigate the risks for each entity.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile