The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Nov. 20, 2020
International Business Machines Corporation, Armonk, NY (US);
Ravi Chandra Chamarthy, Hyderabad, IN;
Manish Anand Bhide, Hyderabad, IN;
Madhavi Katari, Hyderabad, IN;
Arunkumar Kalpathi Suryanarayanan, Chennai, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A machine learning model data quality improvement detection tool is provided for identifying an accurate reference group and an accurate monitored group of a machine learning model. The tool monitors a behavior of the machine learning model for a predetermined time frame. The tool compares a determined fairness metric a pre-defined fairness threshold. Responsive to the fairness metric failing to meet the pre-defined fairness threshold, the tool modifies the monitored group to include a first portion of the reference group. The tool compares a newly determined fairness metric to the pre-defined fairness threshold. Responsive to the newly determined fairness metric meeting the pre-defined fairness threshold, the tool identifies the modified monitored group including the first portion of the user-defined reference group as a new monitored group and the modified reference group without the first portion of the user-defined reference group as a new reference group.