The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Jan. 30, 2024
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Souripriya Das, Nashua, NH (US);

Daniel Diaz Lopez, Jalisco, MX;

Matthew Steven Perry, Brookline, NH (US);

Eugene Inseok Chong, Concord, MA (US);

Ruben Alejandro Gonzalez Yanez, Jalisco, MX;

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2455 (2019.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24561 (2019.01); G06F 16/2453 (2019.01);
Abstract

Techniques are provided for generating and maintaining Precomputed Result Tables ('PRTs') that are used by a database server to improve performance of SPARQL queries that target an RDF graph set. Each PRT corresponds to a particular pattern, which may be simple-triple, star, or chain. The techniques support the creation of PRTs for chain patterns that contain multiple instances of the same property, and PRTs for star and chain patterns that include reverse properties. Techniques are also described for maintaining such PRTs as Data Manipulation Language (DML) operations make changes to the RDF graph tables that belong to the RDF graph set associated with the PRTs.


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