The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Mar. 04, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Masashi Akutsu, Tokyo, JP;

Satoshi Yokotsuka, Tokyo, JP;

Hiroyuki Mishima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06F 3/14 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); G05B 23/0272 (2013.01); G06F 3/14 (2013.01);
Abstract

Provided are an automatic analysis apparatus in which plurality of units are connected and which can perform maintenance on any unit in parallel, and a maintenance guide method for the automatic analysis apparatus. The control unitcauses a display unitto display a maintenance guide screenin which maintenance guidance (a display region for sampler module, a display region for second analysis module, and a display region for first analysis module) independent of analysis modulesand a sampler moduleis arranged in the same screen.


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