The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Jun. 09, 2022
Hitachi, Ltd., Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
The progress of deterioration of a manufacturing facility is prevented while keeping KPI within an allowable range. A facility diagnosis device includes a deterioration prevention mode definition storage unit that stores information including an operation control method for preventing deterioration of a manufacturing facility or a portion thereof for each of predetermined deterioration prevention modes; a KPI calculation unit that calculates a predetermined KPI by using a deterioration degree predicted for each of the deterioration prevention modes for the manufacturing facility or the portion of the manufacturing facility, and determines whether the KPI satisfies a predetermined condition; a deterioration prevention determination unit that determines a deterioration prevention mode that should be executed from a satisfaction determination result; and a control information output unit that outputs control information on the manufacturing facility or the portion of the manufacturing facility according to the deterioration prevention mode that should be executed.