The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Jun. 17, 2021
Applicants:

Beijing Boe Display Technology Co., Ltd., Beijing, CN;

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Yingying Qu, Beijing, CN;

Jianhua Huang, Beijing, CN;

Qiujie Su, Beijing, CN;

Yifu Chen, Beijing, CN;

Zhihua Sun, Beijing, CN;

Yu Zhang, Beijing, CN;

Jiantao Liu, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1339 (2006.01); G02F 1/1362 (2006.01); G02F 1/1368 (2006.01); G02F 1/1335 (2006.01); G02F 1/1343 (2006.01); H10D 86/40 (2025.01); H10D 86/60 (2025.01);
U.S. Cl.
CPC ...
G02F 1/13396 (2021.01); G02F 1/136286 (2013.01); G02F 1/1368 (2013.01); G02F 1/133512 (2013.01); G02F 1/134309 (2013.01); H10D 86/441 (2025.01); H10D 86/60 (2025.01);
Abstract

A display panel, comprising open areas; a non-open area; an array substrate comprising a first substrate and gate lines, data lines, thin film transistors and raised portions located in the non-open area, wherein orthographic projections of the data lines on the first substrate have overlaps with orthographic projections of the gate lines on the first substrate, orthographic projections of the raised portions on the first substrate are located within the orthographic projections of the gate lines on the first substrate; and a color filter substrate comprising a second substrate and spacers located on a side of the second substrate; wherein orthographic projections of the spacers on the first substrate have overlaps with the orthographic projections of the raised portions and overlapping parts of the data lines and the gate lines on the first substrate.


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