The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Dec. 19, 2019
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Marc Honegger, Romanshorn, CH;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A digital microscope system includes a plurality of camera systems for imaging a target region of an object, each camera system having a digital camera and an optical imaging system being aligned along an optical axis of the camera system, wherein the optical axes of the camera systems are parallel to each other; a microscope stage, on which the object is to be arranged; a positioning device; and a controller configured to control the positioning device to move the plurality of camera systems and the microscope stage relative to each other orthogonally to the optical axes of the camera systems for selectively aligning any one of the camera systems with the target region of the object.