The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
May. 06, 2021
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Rongguang Liang, Tucson, AZ (US);
Xiaobo Tian, Tucson, AZ (US);
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Abstract
Snapshot phase-shifting diffraction modules and associated systems and methods are described that enable high spatial and temporal resolution phase imaging with high immunity to environmental factors such as vibrations and temperature changes. One example optical diffraction phase module includes a polarization grating to produce two circularly polarized light beams with opposite polarizations, a first lens to receive the two circularly polarized beams, and a spatial filter positioned at a focal plane of the first lens. The spatial filter includes two openings, one to spatially filter one of the two circularly polarized light beams, and another opening to allow another circularly polarized light beam to pass. The module also includes a second lens to focus the received light onto an image plane and to enable a phase measurement based a plurality of interferograms. The phase module can be incorporated into a microscope system that operates a reflection or a transmission mode.